学术报告
题目：Probing Electron Transport with a Cryogenic Four-Probe Scanning Tunneling Microscope
时间：10月14日 15：20
地点：光学楼525
嘉宾：Prof. An-Ping Li Oak Ridge National Laboratory
摘要
Four-probe STM is a “nano” version of a conventional four-probe station; it combines STM local imaging and spectroscopy functions with four-point contact electrical transport capability in a well-controlled sample environment at temperatures down to 8 K.
In this talk, I will give a brief overview on the capabilities of ORNL four-probe STM, and then provide a couple of examples to demonstrate how we are using this unique platform to study the distribution and flow of electrons over multiple length scales, from individual atoms, molecules, to nanostructures and mesoscopic systems. My focus will be on the electron charge-order fluctuations in ultra thin silicide nanowires grown on a silicon surface and the manipulation of the competing electronic phases near the Mott metal-insulator transition in a correlated electron system of ruthenate. The goal of this research is to establish the relationship between transport functionalities and microscopic competing order parameters of electron and lattice. This research was sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.
